Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Applied Crystallography
سال: 2018
ISSN: 1600-5767
DOI: 10.1107/s1600576718001450